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UZUHASHI, Jun
Address
305-0047 1-2-1 Sengen Tsukuba Ibaraki JAPAN [Access]
  • Publications and presentations

[Research papers] |[Books] |[Proceedings] |[Presentations] |[Patents]

Books TSV

Proceedings TSV

Presentations TSV

2019
  1. KUMAR Ashutosh, UZUHASHI Jun, OHKUBO Tadakatsu, Ryo Tanaka, Shinya Takashima, Masaharu Edo, HONO Kazuhiro. APT and STEM based defects analysis in Mg-implanted GaN layers with varying Mg concentrations. 30th International Conference on Defects in Semiconductors. 2019

Patents TSV

Registered patents
    Patent applications
      International patents

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