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FIB-SEMによる膜厚制御TEM試料作製技術の確立
(Development of thickness-controlled TEM sample preparation by FIB-SEM)
日本顕微鏡学会 第81回学術講演会. June 09, 2025-June 11, 2025.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2025-06-12 03:07:44 +0900 Updated at: 2025-06-12 03:07:44 +0900