HOME > 論文 > 書誌詳細Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formationEmi Kano, Keita Kataoka, Jun Uzuhashi, Kenta Chokawa, Hideki Sakurai, Akira Uedono, Tetsuo Narita, Kacper Sierakowski, Michal Bockowski, Ritsuo Otsuki, Koki Kobayashi, Yuta Itoh, Masahiro Nagao, Tadakatsu Ohkubo, Kazuhiro Hono, Jun Suda, Tetsu Kachi, Nobuyuki Ikarashi. Journal of Applied Physics 132 [6] 065703. 2022.https://doi.org/10.1063/5.0097866 Open Access AIP Publishing (Publisher) Materials Data Repository (MDR) NIMS著者埋橋 淳大久保 忠勝宝野 和博Materials Data Repository (MDR)上の本文・データセットMDRavailable Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation 作成時刻: 2022-10-15 03:21:51 +0900更新時刻: 2024-09-05 08:57:48 +0900
