Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Characterization of δNi₂Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography

Hirokazu Sasaki, Syunta Akiya, Kuniteru Mihara, Yojiro Oba, Masato Onuma, Jun Uzuhashi, Tadakatsu Ohkubo.

MATERIALS TRANSACTIONS 66 [1] MT-D2024005. 2025.

https://doi.org/10.2320/matertrans.mt-d2024005

Open Access Japan Institute of Metals (Publisher) Materials Data Repository (MDR)

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Materials Data Repository (MDR)上の本文・データセット

MDRavailable Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography

作成時刻: 2024-12-26 03:16:52 +0900更新時刻: 2024-12-27 03:17:13 +0900

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