HOME > 論文 > 書誌詳細Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron MicroscopyHideyo Tsurusawa, Jun Uzuhashi, Yusuke Kozuka, Koji Kimoto, Tadakatsu Ohkubo. Small Methods 2301425. 2024.https://doi.org/10.1002/smtd.202301425 Open Access Wiley (Publisher) Materials Data Repository (MDR) NIMS著者埋橋 淳小塚 裕介木本 浩司大久保 忠勝Materials Data Repository (MDR)上の本文・データセットMDRavailable Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron Microscopy 作成時刻: 2024-09-20 03:11:59 +0900 更新時刻: 2026-02-07 04:30:19 +0900
