HOME > その他の文献 > 書誌詳細Characterization of Vacancy-Type Defects in Mg- and N-Implanted GaN by using a Monoenergetic Positron BeamAkira Uedono, Ryo Tanaka, Shinya Takashima, Katsunori Ueno, Masaharu Edo, Kohei Shima, Shigefusa F. Chichibu, Jun Uzuhashi, Tadakatsu Ohkubo, Shoji Ishibashi, Kacper Sierakowski, Michal Bockowski. 2025 22nd International Workshop on Junction Technology (IWJT) 2025 22nd International Workshop on Junction Technology (IWJT) 79-82. 2025.https://doi.org/10.23919/iwjt66253.2025.11072893 Open Access IEEE (Publisher) Materials Data Repository (MDR) NIMS著者埋橋 淳大久保 忠勝Materials Data Repository (MDR)上の本文・データセットMDRavailable Characterization of Vacancy-Type Defects in Mg- and N-Implanted GaN by using a Monoenergetic Positron Beam 作成時刻: 2025-09-18 03:11:36 +0900 更新時刻: 2026-03-24 06:03:56 +0900
