An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy

Jun Uzuhashi, Tadakatsu Ohkubo, Kazuhiro Hono.

Microscopy and Microanalysis 30 [6] 1124-1129. 2025.

https://doi.org/10.1093/mam/ozae015

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作成時刻: 2025-02-23 03:11:51 +0900 更新時刻: 2026-08-11 04:37:57 +0900

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