HOME > 論文 > 書誌詳細Investigation of Deep States in GaN Metal-Oxide-Semiconductor InterfacesYoshihiro Irokawa, Mamoru Usami, Jun Uzuhashi, Tadakatsu Ohkubo, Toshihide Nabatame, Yasuo Koide. ECS Journal of Solid State Science and Technology 15 [5] 055002. 2026.https://doi.org/10.1149/2162-8777/ae6689 Open Access The Electrochemical Society (Publisher) Materials Data Repository (MDR) NIMS著者色川 芳宏埋橋 淳大久保 忠勝生田目 俊秀Materials Data Repository (MDR)上の本文・データセットMDRavailable Investigation of Deep States in GaN Metal-Oxide-Semiconductor Interfaces 作成時刻: 2026-05-14 03:05:39 +0900 更新時刻: 2026-08-17 04:32:03 +0900
