A controllable and efficient method for the fabrication of a single HfC nanowire field-emission point electron source aided by low keV FIB milling | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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A controllable and efficient method for the fabrication of a single HfC nanowire field-emission point electron source aided by low keV FIB milling

Shuai Tang, Jie Tang, Ta-Wei Chiu, Jun Uzuhashi, Dai-Ming Tang, Tadakatsu Ohkubo, Masanori Mitome, Fumihiko Uesugi, Masaki Takeguchi, Lu-Chang Qin.

Nanoscale 12 [32] 16770-16774. 2020.

https://doi.org/10.1039/d0nr03406a

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作成時刻: 2020-12-04 03:00:18 +0900更新時刻: 2024-11-13 04:33:14 +0900

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