A controllable and efficient method for the fabrication of a single HfC nanowire field-emission point electron source aided by low keV FIB milling | SAMURAI, NIMS Researchers Directory Service

HOME > Article > Detail

A controllable and efficient method for the fabrication of a single HfC nanowire field-emission point electron source aided by low keV FIB milling

Shuai Tang, Jie Tang, Ta-Wei Chiu, Jun Uzuhashi, Dai-Ming Tang, Tadakatsu Ohkubo, Masanori Mitome, Fumihiko Uesugi, Masaki Takeguchi, Lu-Chang Qin.

Nanoscale 12 [32] 16770-16774. 2020.

https://doi.org/10.1039/d0nr03406a

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2020-12-04 03:00:18 +0900Updated at: 2025-01-15 04:33:03 +0900

▲ Go to the top of this page