APT and STEM based defects analysis in Mg-implanted GaN layers with varying Mg concentrations
30th International Conference on Defects in Semiconductors. 2019.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2019-08-03 03:00:20 +0900更新時刻: 2019-08-03 03:00:20 +0900