SAMURAI - NIMS Researchers Database

HOME > Presentation > Detail

APT and STEM based defects analysis in Mg-implanted GaN layers with varying Mg concentrations

KUMAR, Ashutosh, UZUHASHI, Jun, OHKUBO, Tadakatsu, Ryo Tanaka, Shinya Takashima, Masaharu Edo, HONO, Kazuhiro.
30th International Conference on Defects in Semiconductors. 2019.

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

    Created at: 2019-08-03 03:00:20 +0900Updated at: 2019-08-03 03:00:20 +0900

    ▲ Go to the top of this page