HOME > 論文 > 書誌詳細Systematic study of FIB-induced damage for the high-quality TEM sample preparationJun Uzuhashi, Tadakatsu Ohkubo. Ultramicroscopy 262 113980. 2024.https://doi.org/10.1016/j.ultramic.2024.113980 NIMS著者埋橋 淳大久保 忠勝Materials Data Repository (MDR)上の本文・データセット作成時刻: 2024-05-08 03:12:52 +0900 更新時刻: 2025-12-28 06:58:23 +0900
