Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM

Jun Uzuhashi, Yuanzhao Yao, Tadakatsu Ohkubo, Takashi Sekiguchi.

Microscopy 74 [4] 279-285. 2025.

https://doi.org/10.1093/jmicro/dfaf006

Open Access Oxford University Press (OUP) (Publisher) Materials Data Repository (MDR)

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Materials Data Repository (MDR)上の本文・データセット

MDRavailable Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM

作成時刻: 2025-08-19 03:09:12 +0900 更新時刻: 2026-03-26 04:31:32 +0900

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