Atomic-scale observation of native oxides on <i>c</i> - and <i>m</i> -faced GaN surfaces | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Atomic-scale observation of native oxides on c - and m -faced GaN surfaces

Jun Uzuhashi, Yoshihiro Irokawa, Toshihide Nabatame, Yasuo Koide, Tadakatsu Ohkubo.

AIP Advances 16 [4] 045004. 2026.

https://doi.org/10.1063/5.0322514

Open Access AIP Publishing (Publisher) Materials Data Repository (MDR)

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Materials Data Repository (MDR)上の本文・データセット

MDRavailable Atomic-scale observation of native oxides on <i>c</i> - and <i>m</i> -faced GaN surfaces

作成時刻: 2026-04-03 03:06:53 +0900 更新時刻: 2026-09-08 04:30:06 +0900

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