HOME > 論文 > 書誌詳細Atomic-scale quantitative analysis of implanted Mg in annealed GaN layers on free-standing GaN substratesAshutosh Kumar, Jun Uzuhashi, Tadakatsu Ohkubo, Ryo Tanaka, Shinya Takashima, Masaharu Edo, Kazuhiro Hono. Journal of Applied Physics 126 [23] 235704. 2019.https://doi.org/10.1063/1.5132345 NIMS著者埋橋 淳大久保 忠勝宝野 和博Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-02-29 03:18:10 +0900 更新時刻: 2026-09-29 05:27:04 +0900
