Atomic-scale quantitative analysis of implanted Mg in annealed GaN layers on free-standing GaN substrates | SAMURAI, NIMS Researchers Directory Service

Scheduled downtime (October 31st and November 1st, 2026) (2026-10-29)

HOME > Article > Detail

Atomic-scale quantitative analysis of implanted Mg in annealed GaN layers on free-standing GaN substrates

Ashutosh Kumar, Jun Uzuhashi, Tadakatsu Ohkubo, Ryo Tanaka, Shinya Takashima, Masaharu Edo, Kazuhiro Hono.

Journal of Applied Physics 126 [23] 235704. 2019.

https://doi.org/10.1063/1.5132345

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2020-02-29 03:18:10 +0900 Updated at: 2026-10-30 05:28:36 +0900

▲ Go to the top of this page