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NIMS Award Symposium 2026

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You can search NIMS articles by Clarivate ESI category (Materials Science, Physics, Chemistry, Engineering, Biology and etc.), title and terms from abstract.

Last updated: November 11, 2026

49734 article(s) found. Sorted by publication dates. (Help)
  • Ken Takazawa, Yasutaka Kitahama, Yasuyuki Kimura, Giyuu Kido. Optical waveguide self-assembled from organic dye molecules in solution. Nano Letters. 5 [7] (2005) 1293-1296 10.1021/nl050469y
  • Masaru Muramatsu, Kosho Akatsuka, Yasuo Ebina, Kezhi Wang, Takayoshi Sasaki, Takao Ishida, Koji Miyake, Masa-aki Haga. Fabrication of Densely Packed Titania Nanosheet Films on Solid Surface by Use of Langmuir-Blodgett Deposition Method without Amphiphilic Additives. Langmuir. 21 [14] (2005) 6590-6595 10.1021/la050293f
  • Panče Naumov, Kenji Sakurai. Reversible thermal gating of the photochromic properties of 3-methyl-2-(2',4'-dinitrobenzyl)pyridine in a single crystal. Crystal Growth & Design. 5 [5] (2005) 1699-1701 10.1021/cg050328+
  • Z.Q. Chen, S. Yamamoto, A. Kawasuso, Y. Xu, T. Sekiguchi. Characterization of homoepitaxial and heteroepitaxial ZnO films grown by pulsed laser deposition. Applied Surface Science. 244 [1-4] (2005) 377-380 10.1016/j.apsusc.2004.10.093
  • Z. Q. Chen, A. Kawasuso, Y. Xu, H. Naramoto, X. L. Yuan, T. Sekiguchi, R. Suzuki, T. Ohdaira. Microvoid formation in hydrogen-implanted ZnO probed by a slow positron beam. Physical Review B. 71 [11] (2005) 115213 10.1103/physrevb.71.115213
  • Jun Chen, Deren Yang, Zhenqiang Xi, Takashi Sekiguchi. Electron-beam-induced current study of hydrogen passivation on grain boundaries in multicrystalline silicon: Influence of GB character and impurity contamination. Physica B: Condensed Matter. 364 [1-4] (2005) 162-169 10.1016/j.physb.2005.04.008
  • R. Buckmaster, J.H. Yoo, K. Shin, Y. Yao, T. Sekiguchi, M. Yokoyama, T. Hanada, T. Goto, M. Cho, Y. Kawazoe, T. Yao. GaN nanodot fabrication by implant source growth. Microelectronics Journal. 36 [3-6] (2005) 456-459 10.1016/j.mejo.2005.02.046
  • X. L. Yuan, T. Sekiguchi, J. Niitsuma, Y. Sakuma, S. Ito, S. G. Ri. Inhomogeneous distribution of dislocations in a SiGe graded layer and its influence on surface morphology and misfit dislocations at the interface of strained Si/Si0.8Ge0.2 . Applied Physics Letters. 86 [16] (2005) 162102 10.1063/1.1905802
  • J CHEN, T SEKIGUCHI, R XIE, P AHMET, T CHIKYO, D YANG, S ITO, F YIN. Electron-beam-induced current study of small-angle grain boundaries in multicrystalline silicon. Scripta Materialia. 52 [12] (2005) 1211-1215 10.1016/j.scriptamat.2005.03.010
  • 原田 広史. ジェットエンジンおよびガスタービン用超耐熱合金開発の現状と展望. 金属. 75 [7] (2005) 619-625
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