HOME > 論文 > 書誌詳細Microvoid formation in hydrogen-implanted ZnO probed by a slow positron beamZ. Q. Chen, A. Kawasuso, Y. Xu, H. Naramoto, X. L. Yuan, T. Sekiguchi, R. Suzuki, T. Ohdaira. Physical Review B 71 [11] 115213. 2005.https://doi.org/10.1103/physrevb.71.115213 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻 :2016-05-24 14:46:24 +0900 更新時刻 :2022-01-10 16:06:09 +0900