| 232件の論文が見つかりました。論文は出版年月日順に表示しています。（ヘルプ） | |
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| K. Harada, K. Shimada, Y. A. Ono, Y. Iwasaki, K. Niitsu, D. Shindo. Electron holography study on vortex beam phases in real space. Microscopy and Microanalysis. 24 [S1] (2018) 1470-1471 10.1017/s1431927618007833 | |
| Minghui Song, Hiroshi Araki, Seiji Kuroda, Kazuhiko Sakaki. EELS of the Interface between Al and Glass Formed with a High Speed Collision Process of Cold Spray. Microscopy and Microanalysis. 24 [S1] (2018) 468-469 10.1017/s1431927618002830 | |
| Toshihide Agemura, Takashi Sekiguchi. Collection efficiency and acceptance maps of electron detectors for understanding signal detection on modern scanning electron microscopy. Microscopy. 67 [1] (2018) 18-29 10.1093/jmicro/dfx124 | |
| HAMAOKA, Takumi, Chih-Yu Jao, TAKEGUCHI, Masaki. Annular dark-field scanning confocal electron microscopy studied using multislice simulations. MICROSCOPY (JOURNAL OF ELECTRON MICROSCOPY). 67 [4] (2018) 232-243 | |
| Akihisa Takeuchi, Kentaro Uesugi, Masayuki Uesugi, Fumiyoshi Yoshinaka, Nakamura. Nondestructive Multiscale X-Ray Tomography by Combining Microtomography and High-Energy Phase-Contrast Nanotomography. Microscopy and Microanalysis. 24 [S2] (2018) 108-109 10.1017/s1431927618012928 | |
| Kazuo Ishizuka, Koji Kimoto. Do We Need Three-Dimensional Fourier Transform Analysis to Evaluate High-Performance TEMs?. Microscopy Today. 26 [2] (2018) 42-49 10.1017/s1551929517001407 | |
| Masami Terauchi, Haruhiko Morito, Hisanori Yamane, Shogo Koshiya, Koji Kimoto. Soft X-ray emission spectroscopy study of electronic structure of sodium borosilicide Na8B74.5Si17.5. Microscopy. 67 [suppl_1] (2018) i72-i77 10.1093/jmicro/dfx132 | |
| Raman Bekarevich, Kazutaka Mitsuishi, Tsuyoshi Ohnishi, Fumihiko Uesugi, Masaki Takeguchi, Yoshiyuki Inaguma, Takahisa Ohno, Kazunori Takada. Two-dimensional Gaussian fitting for precise measurement of lattice constant deviation from a selected-area diffraction map. Microscopy. 67 [suppl_1] (2018) i142-i149 10.1093/jmicro/dfx121 | |
| Hiroaki Suzuki, Zentaro Akase, Kodai Niitsu, Toshiaki Tanigaki, Daisuke Shindo. Secondary electron effect on electron beam induced charging of SiO2particle analyzed by electron holography. Microscopy. (2017) 10.1093/jmicro/dfw112 | |
| Kunji Shigeto, Takio Kizu, Kazuhito Tsukagoshi, Toshihide Nabatame. Radial Interference Contrast in in-situ SEM Observation of Metal Oxide Semiconductor Film Crystallization. Microscopy and Microanalysis. 23 [S1] (2017) 1512-1513 10.1017/s1431927617008224 | |
