HOME > 論文 > 書誌詳細Secondary electron effect on electron beam induced charging of SiO2particle analyzed by electron holographyHiroaki Suzuki, Zentaro Akase, Kodai Niitsu, Toshiaki Tanigaki, Daisuke Shindo. Microscopy . 2017.https://doi.org/10.1093/jmicro/dfw112 NIMS著者新津 甲大Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-04-05 13:14:27 +0900更新時刻: 2024-03-31 15:34:22 +0900
