HOME > 論文 > 書誌詳細Radial Interference Contrast in in-situ SEM Observation of Metal Oxide Semiconductor Film CrystallizationKunji Shigeto, Takio Kizu, Kazuhito Tsukagoshi, Toshihide Nabatame. Microscopy and Microanalysis 23 [S1] 1512-1513. 2017.https://doi.org/10.1017/s1431927617008224 NIMS著者塚越 一仁生田目 俊秀Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-11-11 20:55:11 +0900 更新時刻: 2025-04-16 05:04:38 +0900
