HOME > 論文 > 書誌詳細Two-dimensional Gaussian fitting for precise measurement of lattice constant deviation from a selected-area diffraction mapRaman Bekarevich, Kazutaka Mitsuishi, Tsuyoshi Ohnishi, Fumihiko Uesugi, Masaki Takeguchi, Yoshiyuki Inaguma, Takahisa Ohno, Kazunori Takada. Microscopy 67 [suppl_1] i142-i149. 2018.https://doi.org/10.1093/jmicro/dfx121 NIMS著者三石 和貴大西 剛上杉 文彦竹口 雅樹大野 隆央高田 和典Materials Data Repository (MDR)上の本文・データセット作成時刻 :2017-12-20 20:50:30 +0900 更新時刻 :2020-11-16 22:51:04 +0900