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著者名Raman Bekarevich, Kazutaka Mitsuishi, Tsuyoshi Ohnishi, Fumihiko Uesugi, Masaki Takeguchi, Yoshiyuki Inaguma, Takahisa Ohno, Kazunori Takada.
タイトルTwo-dimensional Gaussian fitting for precise measurement of lattice constant deviation from a selected-area diffraction map
掲載誌名Microscopy 67 [suppl_1] i142-i149
ISSN: 20505698 20505701
発表年2018
言語English
ESIでのカテゴリ
DOIhttps://doi.org/10.1093/jmicro/dfx121
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