HOME > 論文 > 書誌詳細Two-dimensional Gaussian fitting for precise measurement of lattice constant deviation from a selected-area diffraction mapRaman Bekarevich, Kazutaka Mitsuishi, Tsuyoshi Ohnishi, Fumihiko Uesugi, Masaki Takeguchi, Yoshiyuki Inaguma, Takahisa Ohno, Kazunori Takada. Microscopy 67 [suppl_1] i142-i149. 2018.https://doi.org/10.1093/jmicro/dfx121 NIMS著者三石 和貴上杉 文彦竹口 雅樹高田 和典Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-12-20 20:50:30 +0900 更新時刻: 2026-01-25 06:15:37 +0900
