Two-dimensional Gaussian fitting for precise measurement of lattice constant deviation from a selected-area diffraction map | SAMURAI, NIMS Researchers Directory Service

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Two-dimensional Gaussian fitting for precise measurement of lattice constant deviation from a selected-area diffraction map

Raman Bekarevich, Kazutaka Mitsuishi, Tsuyoshi Ohnishi, Fumihiko Uesugi, Masaki Takeguchi, Yoshiyuki Inaguma, Takahisa Ohno, Kazunori Takada.

Microscopy 67 [suppl_1] i142-i149. 2018.

https://doi.org/10.1093/jmicro/dfx121

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Created at: 2017-12-20 20:50:30 +0900 Updated at: 2026-11-04 06:20:16 +0900

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