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Two-dimensional Gaussian fitting for precise measurement of lattice constant deviation from a selected-area diffraction map

Raman Bekarevich, Kazutaka Mitsuishi, Tsuyoshi Ohnishi, Fumihiko Uesugi, Masaki Takeguchi, Yoshiyuki Inaguma, Takahisa Ohno, Kazunori Takada.
Microscopy 67 [suppl_1] i142-i149. 2018.
https://doi.org/10.1093/jmicro/dfx121

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