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AuthorRaman Bekarevich, Kazutaka Mitsuishi, Tsuyoshi Ohnishi, Fumihiko Uesugi, Masaki Takeguchi, Yoshiyuki Inaguma, Takahisa Ohno, Kazunori Takada.
TitleTwo-dimensional Gaussian fitting for precise measurement of lattice constant deviation from a selected-area diffraction map
Journal titleMicroscopy 67 suppl_1 i142 i149
ISSN: 20505701 20505698
Year of publication2018
LanguageEnglish
DOI10.1093/jmicro/dfx121
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