SAMURAI - NIMS Researchers Database

HOME > Article > Detail

Two-dimensional Gaussian fitting for precise measurement of lattice constant deviation from a selected-area diffraction map

Raman Bekarevich, Kazutaka Mitsuishi, Tsuyoshi Ohnishi, Fumihiko Uesugi, Masaki Takeguchi, Yoshiyuki Inaguma, Takahisa Ohno, Kazunori Takada.
Microscopy 67 [suppl_1] i142-i149. 2018.
https://doi.org/10.1093/jmicro/dfx121

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

    Created at: 2017-12-20 20:50:30 +0900Updated at: 2024-04-01 23:57:57 +0900

    ▲ Go to the top of this page