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You can search NIMS articles by Clarivate ESI category (Materials Science, Physics, Chemistry, Engineering, Biology and etc.), title and terms from abstract.

Last updated: May 02, 2024

45796 article(s) found. Sorted by publication dates. (Help)
  • Seiji Kuroda, Takeshi Fukushima, Masaki Sasaki, Toshiaki Kodama. Microstructure and corrosion resistance of HVOF sprayed 316L stainless steel and Hastelloy C coatings. MATERIALS TRANSACTIONS. 43 [12] (2002) 3177-3183 10.2320/matertrans.43.3177
  • T Mori, F Zhang. Low Temperature Magnetism of the B12 Cluster Compound GdB18Si5. Journal of Physics: Condensed Matter. 14 [45] (2002) 11831-11836 10.1088/0953-8984/14/45/324
  • Takaho Tanaka, Akiji Yamamoto, Akira Sato. A Novel Boron-rich Scandium Borocarbide;Sc4.5-xB57-y+zC3.5-z(x=0.27,y=1.1,z=0.2). Journal of Solid State Chemistry. 168 [1] (2002) 192-201 10.1006/jssc.2002.9709
  • 大川 祐司, 青野 正和. 表面におけるドミノ倒し現象 -STM誘起連鎖重合反応-. 表面科学. 23 [11] (2002) 702-707
  • 奥山 秀男, 小澤 清, Satoru Ohno, 目 義雄. 「活性プラズマ-金属」反応法によるPd-TiN系複合超微粒子の作製. Journal of the Japan Society of Powder and Powder Metallurgy. 49 [6] (2002) 527-530 10.2497/jjspm.49.527
  • Alexei A. Belik, Fujio Izumi, Takuji Ikeda, Artem P. Malakho, Bogdan I. Lazoryak. Strontium phosphates with beta-Ca3(PO4)2-type structures: Si9NiLi(PO4)7, Sr9.04Ni1.02Na0.88(PO4)7, and Sr9.08Ni1.04K0.76(PO4)7. J. Mater. Chem.. 12 [12] (2002) 3803-3808 10.1039/b204808f
  • 藤田 大介. 極低バイアス走査トンネル顕微鏡による低次元表面観察. 日本金属学会報 まてりあ. 41 [12] (2002) 846-847
  • Dong-Bok Lee, Yu-Dong Jang, Morihiko Nakamura. High Temperature Oxidation of Ti-47%Al-1%Mn Alloy. MATERIALS TRANSACTIONS. 43 [10] (2002) 2531-2535 10.2320/matertrans.43.2531
  • Soshu Kirihara, Mitsuo Wada Takeda, Kazuaki Sakoda, Yoshinari Miyamoto. Control of microwave emission from electromagnetic crystals by lattice modifications. Solid State Communications. 124 [4] (2002) 135-139 10.1016/s0038-1098(02)00452-0
  • Jun Xu, Yoshio Matsui, Tsuyoshi Kimura, Yoshinori Tokura. Dark-field and bright-field imaging of charge order domains in Nd0,5Ca0.5(Mn0.98Cr0.02)O3. Journal of Electron Microscopy. 51 [suppl 1] (2002) S155-S158 10.1093/jmicro/51.supplement.s155
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