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論文・分野から探す

機構に所属する研究者の発表した論文を、タイトル・抄録・分野などから検索することができます。論文の分野はクラリベイト社のESI分類を参考に分類しています(Materials Science, Physics, Chemistry, Engineering, Biologyなど)。

最終更新日: 2024年03月29日

45696件の論文が見つかりました。論文は出版年月日順に表示しています。(ヘルプ)
  • Y. Wakayama, L. V. Sokolov, N. Zakharov, P. Werner, U. Gösele. Stabilization and fine control of Ge dot structure on Si(100) by C cover layer. Journal of Applied Physics. 93 [1] (2003) 765-767 10.1063/1.1527205
  • DONGFENG, XUE, KITAMURA, Kenji. Crystal Structure and Ferroelectricity of Lithium Niobate Crystals. FERROELECTRICS. 296 (2003) 1-9
  • S. Uji, T. Terashima, S. Yasuzuka, J. Yamaura, H. M. Yamamoto, R. Kato. Fermi surface and angular-dependent magnetoresistance in the organic conductor(BEDT−TTF)2Br(DIA). Physical Review B. 68 [6] (2003) 064420 10.1103/physrevb.68.064420
  • N. Fukata, Y. Yamamoto, K. Murakami, M. Hase, M. Kitajima. In situ spectroscopic measurement of transmitted light related to defect formation in SiO2 during femtosecond laser irradiation. Applied Physics Letters. 83 [17] (2003) 3495-3497 10.1063/1.1623939 Open Access
  • Q. L. Liu, T. Tanaka, J. Q. Hu, F. F. Xu, T. Sekiguchi, 劉泉林, 田中高穂, HU, Junqing, Xu Fang-fang, SEKIGUCHI, TAKEHARU. Green emission from c-axis oriented AlN nanorods doped with Tb. Applied Physics Letters. 83 [24] (2003) 4939-4941
  • Zhongwu Wang, Yusheng Zhao, David Schiferl, C. S. Zha, Robert T. Downs, T. Sekine. Critical pressure for weakening of size-induced sitiffness in spinel-structure Si3N4 nano creystals. Applied Physics Letters. 83 [15] (2003) 3174-3176 10.1063/1.1618365
  • 小野寺恒信, 笠井均, 及川 英俊, 中西八郎. 極性有機ナノ結晶分散系「液・晶」の電場配向制御. 液晶. 7 [2] (2003) 170-175
  • 土田 紀之, 友田 陽, 長井 寿. 超微細フェライト-セメンタイト鋼の静的引張特性. 鉄と鋼. 89 [11] (2003) 1170-1177 10.2355/tetsutohagane1955.89.11_1170
  • Bo Li, Hitoshi Kasai, Hidetoshi Oikawa, Shuji Okada, Kunio Arai, Hachiro Nakanishi. Monodispersed Quinacridone Nanocrystals Prepared by a High-Temperature and High-Pressure Liquid Crystallization Method. Journal of Nanoscience and Nanotechnology. 3 [5] (2003) 365-367 10.1166/jnn.2003.215
  • Z. Q. Chen, S. Yamamoto, M. Maekawa, A. Kawasuso, X. L. Yuan, T. Sekiguchi. Postgrowth annealing of defects in ZnO studied by positron annihilation, X-ray diffraction, Rutherford backscattering, cathodolu. Journal of Applied Physics. 94 [8] (2003) 4807 10.1063/1.1609050
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