SAMURAI - NIMS Researchers Database

HOME > 会議録 > 詳細

Suppression of threshold voltage shift on In-Si-O-C Thin-Film Transistor with an Al2O3 Passivation Layer under Negative and Positive Gate-Bias Stress

著者Kazunori Kurishima, Toshihide Nabatame, Takashi Onaya, Kazuhito Tsukagoshi, Akihiko Ohi, Naoki Ikeda, Takahiro Nagata, Atsushi Ogura.
発表誌名Electron Devices Technology and Manufacturing Conference (EDTM)
発表年2019
言語English
DOIhttps://doi.org/10.1109/edtm.2019.8731167

▲ページトップへ移動