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AuthorKazunori Kurishima, Toshihide Nabatame, Takashi Onaya, Kazuhito Tsukagoshi, Akihiko Ohi, Naoki Ikeda, Takahiro Nagata, Atsushi Ogura.
TitleSuppression of threshold voltage shift on In-Si-O-C Thin-Film Transistor with an Al2O3 Passivation Layer under Negative and Positive Gate-Bias Stress
Proceedings titleElectron Devices Technology and Manufacturing Conference (EDTM)
Year of publication2019
LanguageEnglish
DOI10.1109/edtm.2019.8731167
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