| 90973 presentation(s) found. Sorted by publication dates. (Help) | |
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| KOZAWA, Daichi, Yuto Shiota, Mengyue Wang, Yuichiro Kato. Deterministic formation of single organic color centers in single-walled carbon nanotubes. ICNNQ2026 (International Conference on Nano-photonics, Nano-optoelectronics and Quantum Technology 2026). 2026 Invited | |
| 髙桑 脩, OGAWA, Yuhei, SHIBATA, Akinobu. Hydrogen-Assisted Fatigue Crack Growth in Ferritic Iron-An Overview: A New Fracture Model on Crack-Tip Hydrogen-Dislocation Interaction. 25th European Conference on Fracture (ECF25). 2026 | |
| 伊藤大悟, 江見方敏, 村瀬公俊, 山本文子, 高山 知弘, 片山尚幸. 放射光X線を用いたTl2Ru2O7の高圧構造物性研究. 日本物理学会第81回年次大会. 2026 | |
| 川井 茂樹. スピンを有する分子の表面合成とプローブ顕微鏡を用いた機能開拓. 第87回応用物理学会秋季学術講演会. 2026 Invited | |
| WATANABE, Ikumu, ZHOU, Jiaxin, Keita Kambayashi. Topology optimization of periodic microstructure with misalignment for mechanical metamaterials. Asian Congress of Structural and Multidisciplinary Optimization 2026 (ACSMO 2026). 2026 | |
| EDWARDS, Thomas Edward James, Pshyk Aleksandr, Vrana Lukas, Soucek Pavel, Michler Johann, OHMURA, Takahito. Micromechanical High Temperature Strength and Fracture Toughness of Sputtered High Entropy Nitrides. 12th Pacific Rim International Conference on Advanced Materials and Processing (PRICM 12). 2026 | |
| TSUTSUMI, Yusuke. Investigation of Growth, Stability, and Breakdown of Passive Films in Corrosion-Resistant Metallic Materials Used in Severe Environments on Biomedical and Energy Fields. The 11th International Symposium on the Passivation of Metals and Semiconductors and the Properties of Thin Oxide Layers (Passivity 11). 2026 Invited | |
| 原野 幸治, 緑川 竹美, コレツ オヴィヂュ, 西田 勇希, 大島 義文, 木本 浩司. 分子・ナノ材料の透過電子顕微鏡観察のためのグラフェン支持膜作製. 日本顕微鏡学会 第82回学術講演会. 2026 | |
| 山崎 裕一, 石井 祐太, 雀部 矩正. 完全磁気多極子基底による X 線吸収二色性の理解. 第39回 日本放射光学会年会 放射光科学合同シンポジウム. 2026 | |
| 新宮 やよい, HIROMOTO, Sachiko, DOI, Kotaro, 山本 知之. Polarization behavior of Mg alloy bare metal surfaces with different Al concentrations. Passivity-11 The 11th International Symposium on the Passivation of Metals and Semiconductors and the Properties of Thin. 2026 | |
