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光支援C-V法を用いたAl2O3/n-GaN界面ディープトラップの分析
(Analysis of deep traps at Al2O3/n-GaN interface using photo-assisted C-V measurement)
Solid State Devices and Materials. September 09, 2018-September 13, 2018.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2018-09-27 10:03:39 +0900 Updated at: 2018-09-27 10:03:39 +0900