Influence of post-deposition annealing on interface characteristics at Al2O3/n-GaN
Electron Devices Technology and Manufacturing Conference. 2019.
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Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2019-10-30 03:00:17 +0900更新時刻: 2019-10-30 03:00:17 +0900