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論文・分野から探す

機構に所属する研究者の発表した論文を、タイトル・抄録・分野などから検索することができます。論文の分野はクラリベイト社のESI分類を参考に分類しています（Materials Science, Physics, Chemistry, Engineering, Biologyなど）。

最終更新日: 2024年04月26日

60件の論文が見つかりました。論文は出版年月日順に表示しています。（ヘルプ）
  • H. Yanagisawa, T. Tanaka, Y. Ishida, M. Matsue, E. Rokuta, S. Otani, C. Oshima. Analysis of phonons in graphene sheets by means of HREELS measurement andab initio calculation. Surface and Interface Analysis. 37 [2] (2005) 133-136 10.1002/sia.1948
  • Isao Sakaguchi, Syunichi Hishita, Haruki Ryoken, Yoshiyuki Sato, Hajime Haneda. Effects of annealing on the surface structure of Ga-isotope-implanted single-crystal ZnO. Surface and Interface Analysis. 37 [3] (2005) 332-335 10.1002/sia.2025
  • S. Tanuma, C. J. Powell, D. R. Penn. Calculations of stopping powers of 100 eV to 30 keV electrons in ten elemental solids. Surface and Interface Analysis. 37 [11] (2005) 978-988 10.1002/sia.2092
  • A. Jablonski, C. J. Powell, S. Tanuma. Monte Carlo Strategies for Simulations of Electron Backscattering from Surfaces. Surface and Interface Analysis. 37 [11] (2005) 861-874 10.1002/sia.2104
  • S. Tanuma, T. Shiratori, T. Kimura, K. Goto, S. Ichimura, C. J. Powell. Experimental Determination of Electron Inelastic Mean Free Paths in 13 Elemental Solids in the 50 eV to 5000 eV Energy Range by Elastic-peak Electron Spectroscopy. Surface and Interface Analysis. 37 [11] (2005) 833-845 10.1002/sia.2102 Open Access
  • Takeshi Iyasu, Keiji Tamura, Ryuichi Shimizu, Zengming Zhang, Takanori Koshikawa, Hideki Yoshikawa, Sei Fukushima. Monte-Carlo simulation of secondary electron emission by x-ray irradiation - an application of x-ray absorption near-edge structure (XANES). Surface and Interface Analysis. 36 [10] (2004) 1413-1416 10.1002/sia.1932
  • M. P. Seah, S. J. Spencer, F. Bensebaa, I. Vickridge, H. Danzebrink, M. Krumrey, T. Gross, W. Oesterle, E. Wendler, B. Rheinländer, Y. Azuma, I. Kojima, N. Suzuki, M. Suzuki, S. Tanuma, D. W. Moon, H. J. Lee, Hyun Mo Cho, H. Y. Chen, A. T. S. Wee, T. Osipowicz, J. S. Pan, W. A. Jordaan, R. Hauert, U. Klotz, C. van der Marel, M. Verheijen, Y. Tamminga, C. Jeynes, P. Bailey, S. Biswas, U. Falke, N. V. Nguyen, D. Chandler-Horowitz, J. R. Ehrstein, D. Muller, J. A. Dura. Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: Results of a CCQM pilot study. Surface and Interface Analysis. 36 [9] (2004) 1269-1303 10.1002/sia.1909
  • Isao Sakaguchi, Syunichi Hishita. Quantitative analyses of impurities in ZnO. Surface and Interface Analysis. 36 [7] (2004) 645-648 10.1002/sia.1904
  • Shinjiro Yagyu, Michiko Yoshitake. Distinguishing the dependence of the apparent local barrier on measurement conditions. Surface and Interface Analysis. 36 [8] (2004) 1110-1113 10.1002/sia.1852
  • Michiko Yoshitake, Shinjiro Yagyu. The effect of bias voltage on the measurement of local barrier height. Surface and Interface Analysis. 36 [8] (2004) 1106-1109 10.1002/sia.1851

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