Monte-Carlo simulation of secondary electron emission by x-ray irradiation - an application of x-ray absorption near-edge structure (XANES) | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Monte-Carlo simulation of secondary electron emission by x-ray irradiation - an application of x-ray absorption near-edge structure (XANES)
(X線励起の２次電子放出現象のモンテカルロシミュレーション)

Takeshi Iyasu, Keiji Tamura, Ryuichi Shimizu, Zengming Zhang, Takanori Koshikawa, Hideki Yoshikawa, Sei Fukushima.

Surface and Interface Analysis 36 [10] 1413-1416. 2004.

https://doi.org/10.1002/sia.1932

NIMS著者

吉川英樹

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2016-05-24 15:11:45 +0900 更新時刻: 2026-03-24 05:25:29 +0900

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