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分野別にみる

論文の分野はクラリベイト・アナリティクス社のESI分類を参考に分類し(Materials Science, Physics, Chemistry, Engineering, Biology)、ほか発表文献タイトル・抄録などから2006年以降刊行の論文検索を行うことができます。

最終更新時刻: 2021年02月26日

74件の論文が見つかりました。論文は出版年月日順に表示しています。(ヘルプ)
  • Kun'ichi Miyazawa, Takuro Nagai, Koji Kimoto, Masaru Yoshitake, Yumi Tanaka. Cross‐sectional structural characterization of the surface of exfoliated HOPG using HRTEM‐EELS. Surface and Interface Analysis. 53 [1] (2021) 84-89 10.1002/sia.6875
  • Oleksandr Romanyuk, Oliver Supplie, Agnieszka Paszuk, Jan Philipp Stoeckmann, Regan George Wilks, Jakob Bombsch, Claudia Hartmann, Raul Garcia‐Diez, Shigenori Ueda, Igor Bartoš, Ivan Gordeev, Jana Houdkova, Peter Kleinschmidt, Marcus Bär, Petr Jiříček, Thomas Hannappel. Hard X‐ray photoelectron spectroscopy study of core level shifts at buried GaP/Si(001) interfaces. Surface and Interface Analysis. 52 [12] (2020) 933-938 10.1002/sia.6829
  • Bo Da, Lihao Yang, Jiangwei Liu, Yonggang Li, Shifeng Mao, Zejun Ding. Monte Carlo simulation study of reflection electron energy loss spectroscopy of an Fe/Si overlayer sample. Surface and Interface Analysis. 52 [11] (2020) 742-754 10.1002/sia.6864
  • Kun'ichi Miyazawa, Takuro Nagai, Koji Kimoto, Masaru Yoshitake, Yumi Tanaka. HRTEM‐EELS cross‐sectional structural analyses of glassy carbon substrate irradiated by platinum ions using a coaxial arc plasma gun. Surface and Interface Analysis. 52 [1-2] (2020) 23-33 10.1002/sia.6716
  • Bo Da, Hiroshi Shinotsuka, Hideki Yoshikawa, Shigeo Tanuma. Comparison of the Mermin and Penn models for inelastic mean‐free path calculations for electrons based on a model using optical energy‐loss functions. Surface and Interface Analysis. 51 [6] (2019) 627-640 10.1002/sia.6628
  • Hiroshi Shinotsuka, Shigeo Tanuma, Cedric J. Powell, Dave R. Penn. Calculations of electron inelastic mean free paths. XII. Data for 42 inorganic compounds over the 50 eV to 200 keV range with the full Penn algorithm. Surface and Interface Analysis. 51 [4] (2019) 427-457 10.1002/sia.6598
  • MASUDA, Takuya. Electrochemical X-ray Absorption Fine Structure. Compendium of Surface and Interface Analysis. Chapter 20 (2018) 113-118
  • Hideo Iwai, Yasuko Kajiwara, Noriko Kodani, Catharina T. Migita, Akira Yano, Satoka Aoyagi. Multivariate analysis and g-ogram application to ToF-SIMS data of PEG mixed model sample. Surface and Interface Analysis. 46 [12-13] (2014) 1183-1186 10.1002/sia.5591
  • Hanako Okuno, Masaki Takeguchi, Kazutaka Mitsuishi, Yoshihiro Irokawa, Yoshiki Sakuma, Kazuo Furuya. Local characterizations of quaternary AlInGaN/GaN heterostructures using TEM and HAADF-STEM. Surface and Interface Analysis. 40 [13] (2008) 1660-1663 10.1002/sia.2960
  • Dahlang Tahir, Eun Hye Choi, Young Joon Cho, Suhk Kun Oh, Hee Jae Kang, Hua Jin, Sung Heo, Jae Gwan Chung, Jae Cheol Lee, Sven Tougaard. Electronic and optical properties of La-aluminate dielectric thin films on Si (100). Surface and Interface Analysis. 42 [10-11] (2010) 1566-1569 10.1002/sia.3590
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