HOME > Article > DetailHydrogen effect on Pt/Al2O3/GaN metal-oxide-semiconductor capacitorsYoshihiro Irokawa, Toshihide Nabatame, Akihiko Ohi, Naoki Ikeda, Osami Sakata, Yasuo Koide. Japanese Journal of Applied Physics 58 [10] 100915. 2019.https://doi.org/10.7567/1347-4065/ab476a NIMS author(s)IROKAWA, YoshihiroNABATAME, ToshihideOHI, AkihikoIKEDA, NaokiKOIDE, YasuoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2019-10-09 03:00:19 +0900Updated at: 2024-04-02 00:45:04 +0900
