HOME > 論文 > 書誌詳細Comparative Analysis of Defects in Mg-Implanted and Mg-Doped GaN Layers on Freestanding GaN SubstratesAshutosh Kumar, Kazutaka Mitsuishi, Toru Hara, Koji Kimoto, Yoshihiro Irokawa, Toshihide Nabatame, Shinya Takashima, Katsunori Ueno, Masaharu Edo, Yasuo Koide. Nanoscale Research Letters 13 [1] . 2018.https://doi.org/10.1186/s11671-018-2804-y Open Access Springer Nature (Publisher) NIMS著者三石 和貴原 徹木本 浩司色川 芳宏生田目 俊秀Materials Data Repository (MDR)上の本文・データセット作成時刻: 2019-03-01 11:40:09 +0900 更新時刻: 2026-04-24 05:39:14 +0900
