HOME > Article > DetailComparative Analysis of Defects in Mg-Implanted and Mg-Doped GaN Layers on Freestanding GaN SubstratesAshutosh Kumar, Kazutaka Mitsuishi, Toru Hara, Koji Kimoto, Yoshihiro Irokawa, Toshihide Nabatame, Shinya Takashima, Katsunori Ueno, Masaharu Edo, Yasuo Koide. Nanoscale Research Letters 13 [1] . 2018.https://doi.org/10.1186/s11671-018-2804-y Open Access Springer Nature (Publisher) NIMS author(s)MITSUISHI, KazutakaHARA, ToruKIMOTO, KojiIROKAWA, YoshihiroNABATAME, ToshihideKOIDE, YasuoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2019-03-01 11:40:09 +0900Updated at: 2024-03-31 01:54:45 +0900