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Center for Basic Research on Materials, Advanced Materials Characterization Field: 10 researcher(s) found.
Sorted by the alphabetical order. Displaying from 1 to 10.
- Keywords
eletron microscopy, self-assembly, in-situ imaging, single molecule imaging
- Keywords
有機合成、表面化学合成、有機デバイス、自己組織化
- Keywords
物性II 応用物性・結晶工学 応用物理学一般
- Keywords
High resolution atomic force microscopy for surface chemistry
- Keywords
EELS,STEM,phonon,subgap state
- Keywords
Electron Microscopy, Electron Energy-Loss Spectroscopy, Material Characterization










