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Center for Basic Research on Materials, Advanced Materials Characterization Field, In-situ Electron Microscopy Technique Group: 5 researcher(s) found.
Sorted by the alphabetical order. Displaying from 1 to 5.

ITAKURA, Akiko (板倉 明子)

NIMS Special Researcher, In-situ Electron Microscopy Technique Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords

Surface stress, Thin film, Sensing,

KUSAWAKE, Tomoko (艸分 倫子)

NIMS Engineer, In-situ Electron Microscopy Technique Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

MITSUISHI, Kazutaka (三石 和貴)

Deputy Director, Center for Basic Research on Materials

Keywords

電子顕微鏡技術、ナノ構造科学 応用物性・結晶工学 無機材料・物性

NIITSU, Kodai (新津 甲大)

Independent Scientist, Center for Basic Research on Materials

YAKABE, Taro (矢ヶ部 太郎)

Principal Researcher, In-situ Electron Microscopy Technique Group, Advanced Materials Characterization Field, Center for Basic Research on Materials

Keywords

薄膜・表面界面物性