Bias induced Cu ion migration behavior in resistive change memory structure observed by hard x-ray photoelectron spectroscopy
2014 International Microprocesses and Nanotechnology Conference . 2014.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-01-08 04:57:53 +0900更新時刻: 2017-09-08 21:49:49 +0900