HOME > Presentation > DetailBias induced Cu ion migration behavior in resistive change memory structure observed by hard x-ray photoelectron spectroscopy長田 貴弘, 山下 良之, 吉川 英樹, 井村 将隆, オウ セウンジン, 小橋 和義, 知京 豊裕. 2014 International Microprocesses and Nanotechnology Conference . 2014.NIMS author(s)NAGATA, TakahiroYAMASHITA, YoshiyukiYOSHIKAWA, HidekiIMURA, MasatakaCHIKYO, ToyohiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2017-01-08 04:57:53 +0900 Updated at :2017-09-08 21:49:49 +0900