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Influence of Adsorbed O2 on The Gate-Bias Stress Stability of Back-Gate-Type TFT with Carbon-Doped In2O3 Channel
33rd International Microprocesses and Nanotechnology Conference/https://mnc2020.award-con.com/LOGIN.php. November 09, 2020-November 12, 2020.
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Created at: 2020-12-03 15:05:57 +0900Updated at: 2020-12-03 15:05:57 +0900