| 9件の論文が見つかりました。論文は出版年月日順に表示しています。（ヘルプ） | |
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| Rafael Nadas, Lucas Liberal, Gabriel Bargas, Kenji Watanabe, Takashi Taniguchi, Leonardo C. Campos, Ado Jorio. Substrate‐related optical activity in monolayer WS2${\rm WS}_2$ and MoSe2${\rm MoSe}_2$: A tip‐enhanced Raman spectroscopy study. Journal of Microscopy. 301 [1] (2026) 5-11 10.1111/jmi.70035 | |
| IVAN GUTIERREZ-URRUTIA. Analysis of FIB-induced damage by electron channelling contrast imaging in the SEM. Journal of Microscopy. 265 [1] (2017) 51-59 10.1111/jmi.12462 | |
| HASEGAWA, Akira, ARAKI, Hiroshi, KURODA, Seiji, Kazuhiko Sakaki. Characterization of the Interface between Metal and Glass Produced by Cold Spray. JOURNAL OF MICROSCOPY SOCIETY OF THAILAND. 29 [1] (2016) 7-9 | |
| Y. YUAN, Y.F. GU, Z.H. ZHONG, T. OSADA, C.Y. CUI, T. TETSUI, T. YOKOKAWA, H. HARADA. Creep mechanisms of a new Ni-Co-base disc superalloy at an intermediate temperature. Journal of Microscopy. 248 [1] (2012) 34-41 10.1111/j.1365-2818.2012.03647.x | |
| A. HIRATA, Y. HIROTSU, T. OHKUBO, E. MATSUBARA, A. MAKINO. Local structure studies of Fe-Nb-B metallic glasses using electron diffraction. Journal of Microscopy. 223 [3] (2006) 191-194 10.1111/j.1365-2818.2006.01617.x | |
| HASEGAWA, Akira, MITSUISHI, Kazutaka, FURUYA, Kazuo, C. W. Allen, R. C. Birtcher, S. E. Donnelly. STRUCTURE OF NANOMETER-SIZED XE-INCLUSIONS EMBEDDED IN AL CRYSTALS STUDIED BY TEM. JOURNAL OF MICROSCOPY. (2004) 224-229 | |
| M. Shimojo, K. Mitsuishi, M. Tanaka, M. Han, K. Furuya. Application of transmission electron microscope to nanometre-sized fabrication by means of electron beam-induced deposition. Journal of Microscopy. 214 [1] (2004) 76-79 10.1111/j.0022-2720.2004.01307.x | |
| K. Kimoto, Y. Matsui. Software techniques for EELS to realise about 0.3 eV energy resolution using 300 kV FEG-TEM. Journal of Microscopy. 208 [3] (2002) 224-228 10.1046/j.1365-2818.2002.01083.x | |
| 古屋一夫, 石川信博, C.W.Allew, K. FURUYA, N. ISHIKAWA, C. W. ALLEN. In-situ
observation of shape and atomic structure of Xe nanocrystals embedded in aluminium. Journal of Microscopy. 194 [1] (1999) 152-160 10.1046/j.1365-2818.1999.00451.x | |
