HOME > 論文 > 書誌詳細Analysis of FIB-induced damage by electron channelling contrast imaging in the SEM(Analysis of FIB-induced damage by Electron Channeling Contrast Imaging in the SEM)IVAN GUTIERREZ-URRUTIA. Journal of Microscopy 265 [1] 51-59. 2017.https://doi.org/10.1111/jmi.12462 NIMS著者グティエレス ウルティア イヴァンMaterials Data Repository (MDR)上の本文・データセット作成時刻: 2016-12-22 00:12:37 +0900更新時刻: 2024-04-01 19:00:34 +0900