HOME > Article > DetailAnalysis of FIB-induced damage by electron channelling contrast imaging in the SEM(Analysis of FIB-induced damage by Electron Channeling Contrast Imaging in the SEM)IVAN GUTIERREZ-URRUTIA. Journal of Microscopy 265 [1] 51-59. 2017.https://doi.org/10.1111/jmi.12462 NIMS author(s)GUTIERREZ URRUTIA, IvanFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-12-22 00:12:37 +0900Updated at: 2024-05-02 05:46:55 +0900