HOME > Article > DetailSoftware techniques for EELS to realise about 0.3 eV energy resolution using 300 kV FEG-TEM(300kV FEG-TEMにより0.3eVのエネルギー分解能を実現するためのソフトウエア技術)K. Kimoto, Y. Matsui. Journal of Microscopy 208 [3] 224-228. 2002.https://doi.org/10.1046/j.1365-2818.2002.01083.x NIMS author(s)KIMOTO, KojiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 11:50:42 +0900 Updated at: 2026-10-01 05:26:33 +0900