| 232 article(s) found. Sorted by publication dates. (Help) | |
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| IVAN GUTIERREZ-URRUTIA. Analysis of FIB-induced damage by electron channelling contrast imaging in the SEM. Journal of Microscopy. 265 [1] (2017) 51-59 10.1111/jmi.12462 | |
| Minoru Ochi, Rika Kawano, Takuya Maeda, Yukio Sato, Ryo Teranishi, Toru Hara, Masao Kikuchi, Kenji Kaneko. Three-dimensional studies of intergranular carbides in austenitic stainless steel. Microscopy. (2016) 10.1093/jmicro/dfw103 | |
| Hirofumi Matsuhata, Naoyuki Sugiyama, Bin Chen, Tamotsu Yamashita, Tetsuo Hatakeyama, Takashi Sekiguchi. Surface defects generated by intrinsic origins on 4H-SiC epitaxial wafers observed by scanning electron microscopy. Microscopy. (2016) 10.1093/jmicro/dfw108 | |
| Hirofumi Matsuhata, Naoyuki Sugiyama, Bin Chen, Tamotsu Yamashita, Tetsuo Hatakeyama, Takashi Sekiguchi. Surface defects generated by extrinsic origins on 4H-SiC epitaxial-wafers observed by scanning electron microscopy. Microscopy. (2016) 10.1093/jmicro/dfw107 | |
| Toshihiro Kogure, Noriko Yamaguchi, Hiroyo Segawa, Hiroki Mukai, Satoko Motai, Kotone Akiyama-Hasegawa, Masanori Mitome, Toru Hara, Tsuyoshi Yaita. Constituent elements and their distribution in the radioactive Cs-bearing silicate glass microparticles released from Fukushima nuclear plant. Microscopy. 65 [5] (2016) 451-459 10.1093/jmicro/dfw030 | |
| Takumi Hamaoka, Chih-Yu Jao, Xiaobin Zhang, Yoshifumi Oshima, Masaki Takeguchi. Three-dimensional characterization of Guinier–Preston zones in an Al–Cu alloy using depth-sectioning technique. Microscopy. (2016) 10.1093/jmicro/dfw104 | |
| Ivan Gutierrez-Urrutia. Analysis of dislocation configurations in a [0 0 1] fcc single crystal by electron channeling contrast imaging in the SEM. Microscopy. (2016) 10.1093/jmicro/dfw099 | |
| Shunichi Motomura, Toru Hara, Toshihiro Omori, Ryosuke Kainuma, Minoru Nishida. Morphological and chemical analysis of bainite in Cu–17Al–11Mn (at.%) alloys by using orthogonal FIB-SEM and double-EDS STEM. Microscopy. 65 [3] (2016) 243-252 10.1093/jmicro/dfw003 | |
| Kazuo Ishizuka, Koji Kimoto. Why Do We Need to Use Three-Dimensional (3D) Fourier Transform (FT) Analysis to Evaluate a High-Performance Transmission Electron Microscope (TEM)?. Microscopy and Microanalysis. 22 [05] (2016) 971-980 10.1017/s1431927616011806 | |
| Shunichi Motomura, Yohei Soejima, Takayuki Miyoshi, Toru Hara, Toshihiro Omori, Ryosuke Kainuma, Minoru Nishida. In situheating SEM observation of the bainitic transformation process in Cu–17Al–11Mn (at.%) alloys. Microscopy. 65 [2] (2016) 159-168 10.1093/jmicro/dfv363 | |
