HOME > 論文 > 書誌詳細Why Do We Need to Use Three-Dimensional (3D) Fourier Transform (FT) Analysis to Evaluate a High-Performance Transmission Electron Microscope (TEM)?Kazuo Ishizuka, Koji Kimoto. Microscopy and Microanalysis 22 [05] 971-980. 2016.https://doi.org/10.1017/s1431927616011806 NIMS著者木本 浩司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2017-02-19 23:27:52 +0900更新時刻: 2024-04-01 21:52:49 +0900