HOME > 論文 > 書誌詳細Analysis of dislocation configurations in a [0 0 1] fcc single crystal by electron channeling contrast imaging in the SEM(Analysis of dislocation configurations in a [001] fcc single crystal by Electron Channeling Contrast Imaging in the SEM)Ivan Gutierrez-Urrutia. Microscopy . 2016.https://doi.org/10.1093/jmicro/dfw099 NIMS著者グティエレス ウルティア イヴァンMaterials Data Repository (MDR)上の本文・データセット作成時刻: 2017-05-08 19:02:48 +0900更新時刻: 2024-04-01 21:35:36 +0900