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You can search NIMS articles by Clarivate ESI category (Materials Science, Physics, Chemistry, Engineering, Biology and etc.), title and terms from abstract.

Last updated: May 02, 2024

93 article(s) found. Sorted by publication dates. (Help)
  • Isao Sakaguchi, Syunichi Hishita, Haruki Ryoken, Yoshiyuki Sato, Hajime Haneda. Effects of annealing on the surface structure of Ga-isotope-implanted single-crystal ZnO. Surface and Interface Analysis. 37 [3] (2005) 332-335 10.1002/sia.2025
  • S. Tanuma, C. J. Powell, D. R. Penn. Calculations of stopping powers of 100 eV to 30 keV electrons in ten elemental solids. Surface and Interface Analysis. 37 [11] (2005) 978-988 10.1002/sia.2092
  • A. Jablonski, C. J. Powell, S. Tanuma. Monte Carlo Strategies for Simulations of Electron Backscattering from Surfaces. Surface and Interface Analysis. 37 [11] (2005) 861-874 10.1002/sia.2104
  • S. Tanuma, T. Shiratori, T. Kimura, K. Goto, S. Ichimura, C. J. Powell. Experimental Determination of Electron Inelastic Mean Free Paths in 13 Elemental Solids in the 50 eV to 5000 eV Energy Range by Elastic-peak Electron Spectroscopy. Surface and Interface Analysis. 37 [11] (2005) 833-845 10.1002/sia.2102 Open Access
  • S. Tanuma, C. J. Powell, D. R. Penn. Calculations of electron inelastic mean free paths.VIII. Data for 15 elemental solids over the 50-2000 eV range. Surface and Interface Analysis. 37 [1] (2005) 1-14 10.1002/sia.1997 Open Access
  • YASUFUKU, HIDEYUKI, YOSHIKAWA, Hideki, 木村昌弘, 伊藤和典, 谷克彦, FUKUSHIMA, Sei. Application of X-ray photoemission electron microscope (XPEEM) developed at SPring-8 BL15XU. SURFACE AND INTERFACE ANALYSIS. (2004) 892-895
  • 川野輪仁, 森大輔, 後藤芳彦, SOUDA, Ryutaro. Epitaxial growth of BaO film on Ti buffered MgO(100) surface using low-energy neutral scattering. SURFACE AND INTERFACE ANALYSIS. (2004) 1001-1003
  • Takeshi Iyasu, Keiji Tamura, Ryuichi Shimizu, Zengming Zhang, Takanori Koshikawa, Hideki Yoshikawa, Sei Fukushima. Monte-Carlo simulation of secondary electron emission by x-ray irradiation - an application of x-ray absorption near-edge structure (XANES). Surface and Interface Analysis. 36 [10] (2004) 1413-1416 10.1002/sia.1932
  • M. P. Seah, S. J. Spencer, F. Bensebaa, I. Vickridge, H. Danzebrink, M. Krumrey, T. Gross, W. Oesterle, E. Wendler, B. Rheinländer, Y. Azuma, I. Kojima, N. Suzuki, M. Suzuki, S. Tanuma, D. W. Moon, H. J. Lee, Hyun Mo Cho, H. Y. Chen, A. T. S. Wee, T. Osipowicz, J. S. Pan, W. A. Jordaan, R. Hauert, U. Klotz, C. van der Marel, M. Verheijen, Y. Tamminga, C. Jeynes, P. Bailey, S. Biswas, U. Falke, N. V. Nguyen, D. Chandler-Horowitz, J. R. Ehrstein, D. Muller, J. A. Dura. Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: Results of a CCQM pilot study. Surface and Interface Analysis. 36 [9] (2004) 1269-1303 10.1002/sia.1909
  • Isao Sakaguchi, Syunichi Hishita. Quantitative analyses of impurities in ZnO. Surface and Interface Analysis. 36 [7] (2004) 645-648 10.1002/sia.1904

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